Richard Vook

Emeritus Professor

Biomedical & Chemical Engineering

Courses Taught:

  • X-ray diffraction, transmission electron microscopy and diffraction, scanning electron microscopy and x-ray analysis, materials science for undergraduates, formation and properties of thin solid films.

Degrees:

  • B.A. in Physics, Carleton College (Magna Cum Laude)
  • M.S. in Physics, University of Illinois
  • Ph.D. in Physics, University of Illinois

Honors:

  • Phi Beta Kappa
  • Sigma Xi
  • Pi Mu Epsilon
  • L.B. Pfeil Medal and Prize by the Metals Society of Great Britain

Publications:

Kothari, R., and Vook, R. W., “The Effect of Cold Work on Surface Segregation of Sulfur on OFHC Copper,” Wear 157 (1992) 65.

Aceto, S., Chang, C.Y., and Vook, R.W., “Hillock Growth on Aluminum and Aluminum Alloy Films,” Thin Solid Films 223 (1992) 80.

Vook, R.W., Chang, C.Y., and Park, C.W., “The Role of Surface Diffusion in Electromigration Phenomena,” SPIE Proceedings Vol. 1805 (1993) 232.

Chang, C.Y., and Vook, R.W., “The Effect of Surface Al Oxide Films on Thermally Induced Hollock Formation,” Thin Solid Films 228 (1993) 205.

Park, C.W. and Vook, R.W., “Electromigration in Vacuum Evaporated Cu Films,” Applied Surface Science 70/71 (1993) 639.

Park, C.W. and Vook, R.W., “Electromigration Resustant Cu-Pd Alloy Films,” Thin Solid Films 226 (1993) 238.

Jo, B.H., and Vook, R.W., “Epitaxial Bilayer Growth of CaF2 (111)/Pd(111) on CaF2 (111) Substrates,” J. Vacuum Sci. and technol. All (1993) 1044.

Vook, R.W., “Transmission and Reflection Electron Microscopy of Electromigration Phenomena,” J. Materials Chemistry and Physics 36 (1994) 199.

Jo, B.H., and Vook, R.W., “Dependence of Electromigration Rate on Applied Electric Potential,” Applied Surface Science 89 (1995) 237.

Vook, R.W. and Jo, B.H.,”In Situ UHV Electromigration in Cu Films,” in Advanced Metallization for Future ULSI, edited by K.N. Tu, K.W. Mayer, J.M., Pate, and L.H. Chen (Materials Research Society, vol. 427, Pittsburgh, PA, 1996) p. 83.

Vook, R.W., “Electrical Control of Surface Electromigration Damange,” Thin Solid Films 305 (1997) 286.

Vook, R.W., “Some Experimental Verifications of the Predicted Stranski-Krastanov Thin Film Growth Mode.” Bulgarian Chemical Communications 29 (1996/7) 473.